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Felice CRUPI - Professori Ordinari

Felice CRUPI

Professori Ordinari

Elettronica (IINF-01/A)

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Education
  • Mar. 2001: Ph.D. degree in “Engineering of the Electronic Systems” from the University of Firenze, Italy. Thesis’s title: “On the conduction mechanisms in thin SiO2 films”.
  • Mar. 1997: M.S. degree in Electronic Engineering cum Laude from the University of Messina, Italy. Thesis’s title: “Electrical and structural characterization of thin oxide in poly silicon gate MOS structures”.
  • July 1991: High School Diploma with full grade (60/60) from the Classical Lyceum "Pitagora” of Crotone, Italy. Professional experience
  • 2018 – present: Full Professor of Electronics at the University of Calabria, Rende, Italy
  • 2002 – 2018: Associate Professor of Electronics at the University of Calabria, Rende, Italy
  • 1997 – 2008: Visiting Scientist at the Interuniversity MicroElectronics Center (IMEC), Leuven, Belgium. Research subject: reliability of advanced CMOS devices. Number of research visits: 9. Total spent time: 21 months.
  • Oct. 2006 – Nov. 2006: Visiting Professor at the Department of Electronic Engineering of the Autonomous University of Barcelona, Bellaterra, Spain. Research subject: performance and reliability of CMOS devices and circuits under forward body bias.
  • July 2000 – Sep. 2000: Visiting Scientist at IBM Thomas J. Watson Research Center in Yorktown Heights, New York. Research subject: characterization of breakdown in ultra thin oxide.
  • June 1997 – Oct. 1997: Contract with ST-Microelectronics in collaboration with the National Council of Research, Catania, Italy. Research subject: electrical and structural characterization of oxide layers in MOS structures. Project management
  • June 2021 - present: Scientific Responsible for the University of Calabria of the European project (H2020 - ECSEL Joint Undertaking) “GaN for Advanced Power Applications (GaN4AP)”. Project’s aim: make the GaN-based electronics to become the main technology present in all power converter systems.
  • Jan. 2020 - present: Scientific Responsible for the University of Calabria of the PRIN project “Five Challenges towards Electronics based on 2D Materials (Five2D)”. Project’s aim: assess and contribute to maximize the potential of integrated digital electronics based on two-dimensional materials as a candidate technology to sustain the continuous increase in performance and transistor density popularized as Moore’s law.
  • Nov. 2018 - present: Scientific Responsible for the University of Calabria of the European project (H2020 - ECSEL Joint Undertaking) “First and European SiC Eigth Inches Pilot Line (REACTION)”. Project’s aim: realization of first eigth inches pilot line for SiC technology.
  • June 2017 - Mar. 2021: Scientific Responsible for the University of Calabria of the European project (H2020 - ECSEL Joint Undertaking) “Wide Band Gap Innovative SiC for Advanced Power (WInSiC4AP)”. Project’s aim: design, prototype and demonstrate SiC based highly integrated power demonstrators.
  • Jan. 2015 – Dec. 2016: Scientific Responsible for the University of Calabria of the European project (H2020) “Radiation Hard Resistive Random-Access Memory (R2RAM)”. Project’s aim: design of a rad-hard resistive memory technology.
  • Apr. 2013 – Dec. 2016: Scientific Responsible for the University of Calabria of the European project (FP7 - ENIAC Joint Undertaking) “Energy Efficient Converters using GaN Power Devices (E2COGaN)”. Project’s aim: the demonstration of GaN-on-Si as a disruptive high voltage technology through the whole value chain up to demonstrators.
  • Mar. 2012 – Feb. 2014: National Coordinator of the Italy-Israele joint research project (funded by the Italian Ministry of Foreign Affairs) “Power Electronic Systems based on GaN on Si Technology Option (PEGASO)”. Project’s aim: assessment of the GaN on Si technology for high efficiency power applications.
  • Jan. 2010 – June 2011: Scientific Responsible for the University of Calabria of the Italy-Israele joint research project (funded by the Italian Ministry of Foreign Affairs) “RAd-hard Memories for Storage Embedded Systems (RAMSES)”. Project’s aim: design and realization of a radiation tolerant embedded SRAM for power management platforms actually used to handle general purpose high voltage functions.
  • Mar. 2012 – Feb. 2014: National Coordinator of the Italy-Israele joint research project (funded by the Italian Ministry of Foreign Affairs) “Radiation Immune FLASH Memory (RIFLASH)”. Project’s aim: design and realization of a radiation immune flash memory. Bibliometric indicators (Scopus source)
  • Publications: more than 220
  • Journals: more than 140
  • Conference papers: more than 80
  • Citations: more than 3500
  • h-index: 30 Research areas
  • Reliability of CMOS devices
  • Low-frequency noise in CMOS devices: instrumentation design, measurement and modeling
  • Early assessment of emerging technologies for VLSI logic circuits
  • Modeling and simulation of CMOS devices
  • Design of ultra-low power subthreshold CMOS analog circuits
  • Design of high-efficiency crystalline Silicon solar cells Coordination of research groups with international collaboration Since 2003, Responsible of the Section “Electrical Characterization of Semiconductor Devices” of the "Nanoelectronics and Microsystems Laboratory" (NML) at the University of Calabria. He has activated and coordinated international research collaborations (in the form of joint publications, joint research projects, personal research visits, exchange of students and researchers) between NML and the following Research Institutes, Universities and Electronics Companies:
  • IMEC, Leuven, Belgium
  • Holst Center, Eindhoven, The Netherlands
  • Tyndall National Institute, Cork, Ireland
  • CEA Leti, Grenoble, France
  • IHP Mcroelectronics, Frankfurt (Oder), Germany
  • Jülich Aachen Research Alliance, Germany
  • KU Leuven, Leuven, Belgium
  • Universitat Autonoma de Barcelona, Barcelona, Spain
  • Technische Universität Wien, Wien, Austria
  • Delft University of Technology, The Netherlands
  • Indian Institute of Technology (IIT) Bombay, Powai, India
  • Purdue University, West Lafayette, Indiana, United States of America
  • Universidad San Francisco de Quito, Quito, Ecuador
  • NXP Semiconductors, Eindhoven, The Netherlands
  • Tower Semiconductor Ltd, Migdal Haemek, Israel Supervision of students
  • Academic Supervisor of more than 100 Master students and more than 10 PhD students Awards
  • Best electron device paper award at the IEEE Ecuador Technical Chapters Meeting, Cuenca 2018 for the paper “Reliability in GaN-based devices for power applications” by E. Acurio, L. Trojman, F. Crupi, F. Iucolano, N. Ronchi, B. de Jaeger, B. Bakeroot, S. Decoutere
  • Best paper award at the IEEE International Conference on Microelectronics, Nis 2008 for oral paper “Progressive breakdown dynamics in HfSiON/SiON gate stacks” by E. Miranda, P. Falbo, M. Nafría, F. Crupi
  • Since 2014, senior member of the Institute of Electrical and Electronic Engineers (IEEE) Invited speaker at international conferences
  • F. Crupi et al., “Early Assessment of Tunnel-FET for Energy-Efficient Logic Circuits”, International Conference on Solid State and Integrated-Circuit Technology, pp. 27-30, Hangzhou 2016
  • F. Crupi et al., “The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks”, Meeting of The Electrochemical Society, vol. 19, n. 2, pp. 87-99, San Francisco 2009
  • F. Crupi et al., “Modeling the gate current 1/f noise and its application to advanced CMOS devices”, International Conference on Solid State and Integrated-Circuit Technology, pp. 420-423, Beijing 2008
  • F. Crupi, “Threshold voltage instability and low frequency noise in Hafnium-based gate dielectrics”, Meeting of The Electrochemical Society, vol. 3, n. 3, pp. 205-214, Cancun 2006
  • F. Crupi at al., “Gate current noise evolution and dielectric breakdown of MOS microstructures”, International Conference on Noise and Fluctuations, pp. 775-780, Prague 2003 Editorial activities
  • 2011 - 2022: Associate Editor of IEEE Transactions on Device and Materials Reliability.
  • July 2021: Guest Editor for the Special Issue of Solid-State Electronics on “Advanced Insulating Films on Semiconductors and Related Devices”, Letters from INFOS 2021
  • Dec. 2013: Guest Editor for the Special Section of IEEE Transactions on Device and Materials Reliability on “Reliability of High-Mobility Channel Materials” Organization of conferences and schools
  • General Chair of the 22th conference on Insulating Films On Semiconductors (INFOS), Rende, Italy, 2021.
  • Technical program committee member of the international conferences: - International Reliability Physics Symposium (IRPS), 2004-2005, 2007-2010, 2012 and 2015; - International Electron Devices Meeting (IEDM), 2011 and 2012; - Conference on Solid-State and Integrated-Circuit Technology (ICSICT), 2016; - Insulating Films on Semiconductors (INFOS), 2017.
  • Director of the 6th SINANO Summer PhD School on “Reliability and variability of electron devices”, Bertinoro, Italy, 2014. Selected academic functions
  • 2021 – present: Member of Commission to National Scientific Habilitation for the comeptition sector 09-E3 (Electronics)
  • 2010 – present: Representative of the University of Calabria in the Assembly of the Inter-University Nanoelectronics Team (IUNET)
  • 2015 – 2021: Coordinator of the PhD in ICT at University of Calabria
  • 2004 - 2017, 2020 - present: Erasmus Responsible in the area of Electronic Engineering at the University of Calabria International teaching
  • May 2017 – June 2017: “Nanoelectronic Devices” (24 hours), Master Degree in Nanoelectronics, Universidad San Francisco de Quito, Quito, Ecuador
  • Oct. 2016: “Reliability, Low-Frequency Noise and Early Assessment of CMOS Nanotechnologies” (18 hours), addressed to researchers from Chinese Industries and Universities, organized by Chinese Ministry of Industry and Information Technology, Beijing, China
  • Nov. 2010 – Dec. 2010: “Nanoelectronic Devices” (8 hours), Bachelor Degree in Electrical Engineering, Satakunta University of Applied Sciences, Pori, Finland
  • Oct. 2007: “Low Frequency Noise: Theory, Instrumentation and Measurement”, (8 hours), PhD Degree, KU Leuven, Leuven, Belgium
  • Nov. 2006: “Reliability and Low Frequency Noise Measurements in Advanced CMOS Devices” (8 hours), Master Degree in Micro and Nanoelectronic Engineering, Autonomous University of Barcelona, Barcelona, Spain Service activities in foreign Universities External PhD examiner at:
  • Autonomous University of Barcelona, Spain (4 times)
  • National Institute of Applied Sciences (INSA) of Toulouse, France
  • Technological University of Vienna, Austria
  • University of Twente, Netherlands
  • National Technological University of Buenos Aires, Argentina
  • Indian Institute of Technology Bombay, India
  • Nanyang Technological University, Singapore
  • National University of Singapore, Singapore.
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